辐射防护 ›› 2022, Vol. 42 ›› Issue (5): 395-401.

• 剂量学基础 • 上一篇    下一篇

常见双层介质材料γ射线照射量累积因子的计算与分析

李华, 魏子洋, 赵原, 刘立业, 李会, 韦加富   

  1. 中国辐射防护研究院 核药研发转化与精准防护山西省重点实验室,太原 030006
  • 收稿日期:2021-11-15 出版日期:2022-09-20 发布日期:2022-10-17
  • 通讯作者: 刘立业。E-mail:liuliye@cirp.org.cn
  • 作者简介:李华(1989—),男,2011年本科毕业于清华大学工程物理系核工程与核技术专业,2017年博士毕业于清华大学工程物理系核科学与技术专业,副研究员。E-mail:lihua_7559@126.com
  • 基金资助:
    国家自然科学基金资助项目(项目编号:11305146、11905190);中核集团菁英项目(No.29)。

Calculation and analysis of gamma-ray exposure buildup factor for common double-layer materials

LI Hua, WEI Ziyang, ZHAO Yuan, LIU Liye, LI Hui, WEI Jiafu   

  1. China Institute for Radiation Protection, Shanxi Provincial Key Laboratory forTranslational Nuclear Medicine and Precision Protection, Taiyuan 030006
  • Received:2021-11-15 Online:2022-09-20 Published:2022-10-17

摘要: 使用蒙特卡罗开源程序包Geant4设计并开发了用于双层介质材料累积因子计算程序,计算并建立了核设施现场常见材料水、铁、铅和混凝土两两组合下的照射量累积因子数据库,同时选取了部分计算结果与可靠性较好的经验公式相应模拟数据进行了比较,并分析了造成差异的主要原因。结果表明:基于Geant4模拟计算的双层介质材料照射量累积因子数据与经验公式计算结果相对吻合较好,其偏差大多数在10%以内,验证了累积因子数据计算结果的可靠性。此研究工作可为辐射防护相关模拟计算提供底层数据基础。

关键词: 累积因子, Geant4, 双层介质, 点核积分, 照射量

Abstract: Based on Geant4, a calculation program for the buildup factors of the double-layer materials was developed and the exposure buildup factor database of double-layer combination for some common materials (water, iron, lead and concrete) at nuclear facility site were calculated and established. Meanwhile, some calculation results are compared with corresponding simulation data of empirical formula with good reliability and the main reasons for their difference are analyzed. The results show that the buildup factor data of the double-layer materials calculated by Geant4 are relatively in good agreement with simulation results of the empirical formula. And most of the deviations among them are within 10%, which verifies the reliability of the calculation results of the buildup factors for the double-layer materials by Geant4. The work of this paper can provide underlying data basis for the related simulation of radiation protection field.

Key words: buildup factor, Geant4, double layer medium, point-kernel integral, exposure

中图分类号: 

  • TL72