辐射防护 ›› 2025, Vol. 45 ›› Issue (5): 445-458.

• 综述 • 上一篇    下一篇

直接型半导体中子探测器的研究进展及展望

王林靖1, 王川2, 李华1,3, 李德源1, 陈法国1,3, 刘立业1, 张鹏鹏1   

  1. 1.中国辐射防护研究院,太原 030006;
    2.核电运行研究(上海)有限公司,上海 200126;
    3.核药研发转化与精准防护山西省重点实验室,太原 030006
  • 收稿日期:2024-11-18 出版日期:2025-09-20 发布日期:2026-01-14
  • 通讯作者: 刘立业。E-mail:liuliye@cirp.org.cn
  • 作者简介:王林靖(1999—),男,2022年毕业于东华理工大学核工程与核技术专业,获学士学位,现为中国辐射防护研究院辐射防护及环境保护专业在读硕士研究生。E-mail:wanglj0175@163.com

Research progress and prospects of direct semiconductor neutron detectors

WANG Linjing1, WANG Chuan2, LI Hua1,3, LI Deyuan1, CHEN Faguo1,3, LIU Liye1, ZHANG Pengpeng1   

  1. 1. China Institute for Radiation Protection, Taiyuan 030006;
    2. Nuclear Power Operations Research Institude, Shanghai 200126;
    3. Shanxi Provincial Key Laboratory of Nuclear Drug and Transformation and Precision Protection, Taiyuan 030006
  • Received:2024-11-18 Online:2025-09-20 Published:2026-01-14

摘要: 直接型半导体中子探测器具有体积小、理论探测效率100%及器件结构简单等显著优势,是未来半导体中子探测器重点发展方向。当前,具有明显中子响应且适用于制备直接型半导体中子探测器的新型报道材料有h-BN、LiInSe2及LiInP2Se6三种。本文介绍国内外基于这三种材料类型直接型半导体中子探测器研究的最新进展,主要包括:晶体的制备、表征及生长工艺的优化;晶体的电学特性及载流子传输能力;探测器结构设计及中子探测性能测试等方面。同时对研究现状及发展趋势进行了总结,并在此基础上对直接型半导体中子探测器的发展前景进行了展望。

关键词: 直接型半导体中子探测器, 晶体制备, 电学特性, 器件结构, 中子探测能力

Abstract: Direct semiconductor neutron detectors have significant advantages such as small volume, theoretical detection efficiency of 100%, and simple device structure, making them a key direction for the future development of semiconductor neutron detectors. Currently, novel materials with distinct neutron response capabilities suitable for fabricating direct-type semiconductor neutron detectors include h-BN, LiInSe2 and LiInP2Se6. This paper provides a detailed review of the latest advancements in research on direct semiconductor neutron detectors based on h-BN, LiInSe2 and LiInP2Se6. The review includes the following aspects: crystal growth, characterization and optimization of growth processes; electrical properties of crystals and carrier transport capability; detector structure design and neutron detection performance testing. This paper also summarizes the current research status and development trends, and offers an outlook on the future of direct semiconductor neutron detectors.

Key words: direct semiconductor neutron detectors, crystal growth, electrical properties, device structure, neutron detection performance

中图分类号: 

  • TL816