Abstract: Abstract：Based on a 4quadrant silicon cell, the sun incident angle in two axes can be measured by a dualaxial analog sun sensor simultaneously. Aiming at measurement errors introduced by assembly deviation, the main error sources are analyzed quantificationally, such as the center offset, rotation and tilt between the aperture and silicon cell, and the incline of the optoelectronic component. Based on the presented analyses, the calibration can be realized with high precision.

Key words: Keywords：dualaxial, sun sensor, 4quadrant, error source