Abstract: The SRAM-based FPGA is one of the on-board electrical devices susceptible to radiation. In addition, effects and errors induced by single event effect on SRAM-based FPGA are distinct from others because of its special structure and operation. This paper analyzes in detail diverse fault modes for SRAM-based FPGA in space applications, and investigates broadly the corresponding fault-tolerant methods by taking the mainstream device in this type of FPGA as objects. Results show that we are able to effectively decrease the possibilities of the radiation-induced faults of SRAM-based FPGA by taking appropriate fault tolerant methods.

Key words: radiation effect, FPGA, fault mode analysis, fault-tolerant method