[1]李行善. 自动测试系统集成技术[M]. 北京: 电子工业出版社, 2004
[2]Michael M. New direction for the Dod ATS framework[C]. IEEE Autotestcon 2009, Anaheim, 2009
[3]许爱强. ATML标准的结构和应用研究[J]. 仪表技术,2011(8):17-19
Xu A Q. Research on architecture and applications of ATML[J]. Instrument Technology, 2011(8):17-19
[4]IEEE SCC20. IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via extensible markup language (XML), IEEE standard 1671-2010[S]. New York: Institute of Electrical and Electronics Engineers Inc, 2011
[5]IEEE SCC20. IEEE standard for signal and test definitions, IEEE standard 16412010[S]. New York: Institute of Electrical and Electronics Engineers Inc, 2011
[6]IEEE SCC20. IEEE trialuse standard for software interface for maintenance information collection and analysis (SIMICA): exchanging test results and session information via the extensible markup language (XML), IEEE standard 1636.1-2007[S]. New York:Institute of Electrical and Electronics Engineers Inc, 2008
[7]王军. 基于1641的面向信息模型ATE应用解决方案[J]. 电子设计工程,2012,20(19):85-88
Wang J. An application solutions based on 1641 oriented information model[J]. Electronic Design Engineering, 2012,20(19):85-88