LIPS-200离子推力器关键部组件寿命分析

doi:10.3969/j.issn.1674-1579.2013.04.011

Abstract

Abstract: In combination with the results of the failure mechanism, which was based upon the previous life test of critical components of LIPS-200 ion thruster, this paper synthesizes the academic progress with respect to the lifetime of ion propulsion system by numerical simulation and theoretical analysis. The progress comprises several segments, such as the analysis of electron backstreaming of ion optics, structure failure of accelerator grid and the absolute depletion failure mode of hollow cathode emitter. A credible life range of critical components is derived. The result shows that the ion thruster can satisfy the design configuration. Furthermore, it can provide reference for the lifetime evaluation and performance optimization of ion thruster.

Key words: ion thruster, lifetime, reliability, hollow cathode, grid system

CLC Number:

V439+.1

JIA Yan-Hui, GUO Ning, LI Juan, CHEN Juan-Juan, ZHANG Tian-Ping. Lifetime Analysis of the Key Components of LIPS-200 Ion Thruster[J]., 2013, 39(4): 54-58.

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URL: http://journal01.magtech.org.cn/Jwk3_kjkzjs/EN/10.3969/j.issn.1674-1579.2013.04.011

http://journal01.magtech.org.cn/Jwk3_kjkzjs/EN/Y2013/V39/I4/54

References

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Lifetime Analysis of the Key Components of LIPS-200 Ion Thruster

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