中国科技核心期刊

中文核心期刊

CSCD来源期刊

空间控制技术与应用 ›› 2009, Vol. 35 ›› Issue (1): 51-55.

• 学术研究 • 上一篇    下一篇

星用SRAM型FPGA的故障模式分析和容错方法研究

郝志刚1,杨孟飞2   

  1. 1.北京控制工程研究所,北京 100190;2.中国空间技术研究院,北京 100094
  • 收稿日期:1900-01-01 修回日期:1900-01-01 出版日期:2009-02-25 发布日期:2009-02-25

Fault Mode Analysis and Fault Tolerant Methodology for SRAM-Based FPGA on Spacecraft

HAO Zhigang 1, YANG Mengfei 2   

  1. 1. Beijing Institute of Control Engineering, Beijing 100190, China;
    2. China Academic of Space Technology, Beijing, 100094, China
  • Received:1900-01-01 Revised:1900-01-01 Online:2009-02-25 Published:2009-02-25

摘要: 静态存储器(SRAM, static random access memory)型现场可编程门阵列 (FPGA,field programmable gate array)是一种对空间辐射效应较为敏感的航天器电子元器件。由于其特有的构造和工作方式,单粒子辐射效应对SRAM型FPGA造成的影响及其引起的故障模式有着区别于一般电子元器件的特征。为了提高SRAM型FPGA在空间应用中的可靠性,以该类型FPGA的主流器件作为研究对象,深入分析了FPGA在空间应用中的各种故障模式,研究了相应的各种容错方法。研究表明,通过采取适当的FPGA容错方法,能够有效降低SRAM型FPGA因空间辐射而发生故障的可能性。

关键词: 辐射效应, FPGA, 故障模式分析, 容错方法

Abstract: The SRAM-based FPGA is one of the on-board electrical devices susceptible to radiation. In addition, effects and errors induced by single event effect on SRAM-based FPGA are distinct from others because of its special structure and operation. This paper analyzes in detail diverse fault modes for SRAM-based FPGA in space applications, and investigates broadly the corresponding fault-tolerant methods by taking the mainstream device in this type of FPGA as objects. Results show that we are able to effectively decrease the possibilities of the radiation-induced faults of SRAM-based FPGA by taking appropriate fault tolerant methods.

Key words: radiation effect, FPGA, fault mode analysis, fault-tolerant method

中图分类号: 

  • TP302.8