关键词: 机内测试, 星载电子设备, 测试体系, 分级思想

Abstract: In this paper the necessity and feasibility of the BIT (built in test) technology is applied to the satellite electronic devices are analyzed, based on the investigation of the development of BIT technology. A BIT test system is constructed via using hierarchical ideology to suit for the satellite electronic equipment. A new method is proposed to develop the testability of satellite electronic equipment.

Key words: BIT, satellite electronic device, test architecture, hierarchical ideology